Explain the properties of Heat Treatments and applications. Explain the differences between the ICs and their applications in today’s society. EET191_U5_Lecture2revised-ICs.ppt.pptxE
answer the following and cite your references:
- Explain the properties of Heat Treatments and applications.
- Explain the differences between the ICs and their applications in today's society.
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
PROCESSING OF INTEGRATED CIRCUITS
Overview of IC Processing
Silicon Processing
Lithography
Layer Processes Use in IC Fabrication
Integrating the Fabrication Steps
IC Packaging
Yields in IC Processing
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Integrated Circuit (IC)
A collection of electronic devices such as transistors, diodes, and resistors that have been fabricated and electrically intraconnected onto a small flat chip of semiconductor material
Silicon (Si) – most widely used semiconductor material for ICs
Less common: germanium (Ge) and gallium arsenide (GaAs)
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Levels of Integration in Microelectronics
Integration level Number devices Approx. year
Small scale integration (SSI) 10 ‑ 50 1959
Medium scale integration (MSI) 50 ‑ 103 1960s
Large scale integration (LSI) 103 ‑ 104 1970s
Very large scale integration (VLSI) 104 ‑ 106 1980s
Ultra large scale integration (ULSI) 106 ‑ 108 1990s
Giga scale integration 109 – 1010 2000s
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Overview of IC Technology
An integrated circuit chip consists of hundreds, thousands, or millions of microscopic electronic devices
A chip is a square or rectangular flat plate that is about 0.5 mm (0.020 in) thick and typically 5 to 25 mm (0.2 to 1.0 in) on a side
Each electronic device on the chip surface consists of separate layers and regions with different electrical properties combined to perform a particular function
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Integrated Circuit
Highly magnified image of an integrated circuit (photo courtesy of Intel Corporation)
Cross section of a transistor in an integrated circuit – feature sizes can be less than 40 nm
Video
Fabrication of Integrated Circuits (Animation)
(https://youtu.be/IjVrkYteNwY)
Chip Manufacturing
(https://youtu.be/bor0qLifjz4)
How an Integrated Circuit is made
(https://youtu.be/ThNW0EqOH7U)
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Processing Sequence for Silicon ICs
Silicon processing – sand is reduced to very pure silicon and then shaped into wafers
IC fabrication – processing steps that add, alter, and remove thin layers in selected regions to form electronic devices
Lithography is used to define the regions to be processed on wafer surface
IC packaging – wafer is tested, cut into individual chips, and the chips are packaged
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
(1) Pure silicon is formed from molten state into ingot and then sliced into wafers; (2) fabrication of integrated circuits on wafer; and (3) wafer is cut into chips and packaged
Sequence in IC Processing
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Clean Rooms
Much of the processing of ICs must be carried out in a clean room
Ambiance of a clean room is more like a hospital operating room than a production factory
Cleanliness is dictated by the microscopic feature sizes in an IC, the scale of which continues to decrease each year
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Also shown is the size of common airborne particles that can contaminate the IC processing environment
Trends in IC Feature Size
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Silicon Processing
Microelectronic chips are fabricated on a substrate of semiconductor material
Silicon accounts for more than 95% of all semiconductor devices produced in the world today
Preparation of silicon substrate (wafers) can be divided into three steps:
Production of electronic grade silicon
Crystal growing
Shaping of Si into wafers
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Electronic Grade Silicon
Silicon is one of the most abundant materials in the earth's crust, occurring naturally as silica (e.g., sand) and silicates (e.g., clay)
Principal raw material for silicon is quartzite, which is very pure SiO2
Electronic grade silicon (EGS) is polycrystalline silicon of ultra high purity
Impurities are measured in parts per billion
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Crystal Growing
The silicon substrate for microelectronic chips must be made of a single crystal whose unit cell is oriented in a certain direction
Substrate wafers must be cut in a direction that achieves the desired planar orientation
Most widely used crystal growing method is the Czochralski process
A single crystal boule is pulled from a pool of molten silicon
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Shaping of Silicon into Wafers
Processing steps to reduce the boule into thin, disc‑shaped wafers
Ingot (boule) preparation
Wafer slicing
Wafer preparation
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Preparation of the Boule
The ends of the boule are cut off
Cylindrical grinding is used to shape the boule into a more perfect cylinder
One or more flats are ground along length of boule
(a) Cylindrical grinding provides diameter and roundness control and (b) a flat ground on the cylinder
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Wafer Slicing
Cutting edge is a very thin ring-shaped saw blade with diamond grit on internal diameter
ID used for slicing rather than the OD for better control over flatness, thickness, parallelism, and surface characteristics of the wafer
Wafers are cut 0.5‑0.7 mm (0.020‑0.028 in.) thick, greater thicknesses for larger wafer diameters
To minimize kerf loss, blades are very thin: thickness ~ 0.33 mm (0.013 in)
Wafer slicing using a diamond abrasive cut‑off saw
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Wafer Preparation
Wafer rims are rounded by contour‑grinding wheel to reduce chipping during handling
Wafers are chemically etched to remove surface damage due to slicing
A flat polishing operation is performed to provide surfaces of high smoothness for photolithography processes to follow
Finally, wafer is chemically cleaned to remove residues and organic films
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Lithography
An IC consists of many microscopic regions on the wafer surface that make up the devices and intraconnections as specified in the circuit design
In the planar process, regions are fabricated by steps that add, alter, or remove layers in selected areas of the wafer surface
Each layer is determined by a geometric pattern representing circuit design information that is transferred to the wafer surface by lithography
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Lithographic Technologies
Several lithographic technologies are used in semiconductor processing:
Photolithography
Electron lithography
X‑ray lithography
Ion lithography
The differences are in type of radiation used to transfer the mask pattern to the wafer surface
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Photolithography
Uses light radiation to expose a coating of photoresist on the surface of the wafer
Common light source in wafer processing is ultraviolet light, due to its short wavelength
A mask containing the required geometric pattern for each layer separates the light source from the wafer, so that only the portions of the photoresist not blocked by the mask are exposed
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Photolithography Mask
Flat plate of transparent glass onto which a thin film of an opaque substance has been deposited in certain areas to form the desired pattern
Thickness of glass plate is around 2 mm (0.080 in), while deposited film thickness is only ~ 1 m
The mask itself is fabricated by lithography
The pattern is based on circuit design data, usually the digital output from a CAD system used by circuit designer
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Photoresist
Organic polymer that is sensitive to light radiation in a certain wavelength range
Sensitivity causes either increase or decrease in solubility of the polymer to certain chemicals
Typical practice in semiconductor processing is to use photoresists that are sensitive to UV light because of its shorter wavelength
Also permits fabrication areas in plant to be illuminated at low light levels outside UV band
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Photolithography Exposure Techniques
(a) Contact printing, (b) proximity printing, (c) projection printing
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Photolithography Processing Sequence
Surface of the silicon wafer has been oxidized to form a thin film of SiO2
It is desired to remove the SiO2 film in certain regions as defined by mask pattern
Sequence for a negative resist proceeds as follows:
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Photolithography Processing Sequence
(1) Prepare surface, (2) apply resist, (3) soft bake, (4) align mask and expose, (5) develop resist, (6) hard bake, (7) etch, (8) strip resist
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
A partially processed silicon wafer after several lithography steps (courtesy of George E. Kane Manufacturing Technology Laboratory, Lehigh University)
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Other Lithography Techniques
As feature sizes in integrated circuits continue to decrease and UV photolithography becomes increasingly inadequate, other lithography techniques that offer higher resolution are growing in importance
Extreme ultraviolet (EUV) lithography
Electron beam lithography
X‑ray lithography
Ion lithography
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Layer Processes Used in IC Fabrication
Steps to fabricate ICs on a silicon wafer consist of chemical and physical processes that add, alter, or remove regions defined by photolithography
Regions are insulating, semiconducting, and conducting areas that form the devices and their intraconnections in the IC
Layers are fabricated one at a time, each layer requiring a separate mask, until all of the details have been fabricated onto the wafer surface
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Layering Processes in IC Fabrication
Thermal oxidation – adds SiO2 layer on Si substrate
Chemical vapor deposition – adds various layers
Diffusion and ion implantation – alter chemistry of an existing layer or substrate
Metallization processes – add metal layers for electrical conduction
Etching processes – remove portions of layers to achieve desired IC details
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Thermal Oxidation of Silicon
Exposure of silicon wafer surface to an oxidizing atmosphere at elevated temperature to form layer of silicon dioxide
Oxygen or steam atmospheres are used, with the following reactions, respectively:
Si + O2 SiO2
or
Si + 2H2O SiO2 + 2H2
Growth of SiO2 film on a silicon substrate by thermal oxidation, showing changes in thickness that occur: (1) before oxidation and (2) after thermal oxidation
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Functions of Silicon Dioxide
SiO2 is an insulator, compared to Si which is a semiconductor
Used as a mask to prevent diffusion or ion implantation of dopants into silicon
Can be used to isolate devices in circuit
Provides electrical insulation between levels in multi‑level metallization systems
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Alternative Process for Adding SiO2
When a silicon dioxide film must be applied to surfaces other than silicon, then direct thermal oxidation does not work
An alternative process must be used, such as chemical vapor deposition
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Introduction of Impurities into Silicon
IC technology relies on the ability to alter the electrical properties of silicon by introducing impurities into selected regions of the surface
Called Doping – adding impurities into Si surface
Common doping elements are boron (B), phosphorous (P), arsenic (As), and antimony (Sb)
Techniques for doping silicon:
Thermal diffusion
Ion implantation
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Thermal Diffusion
Process in which atoms migrate from regions of high concentration into regions of lower concentration
In semiconductor processing, diffusion is carried out to dope the silicon substrate with controlled amounts of a desired impurity
Two steps in thermal diffusion:
Predeposition – dopant is deposited onto wafer
Drive‑in – heat treatment in which dopant is redistributed to obtain desired depth and profile
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Ion Implantation
Vaporized ions of impurity element are accelerated by an electric field and directed at silicon substrate
Atoms penetrate into surface, losing energy and finally stopping at some depth in crystal structure determined by mass of ion and acceleration voltage
Advantages:
Can be accomplished at room temperature
Provides exact doping density
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Metallization
Combines various thin film deposition technologies with photolithography to form very fine patterns of conductive material
Functions of conductive materials on wafer surface:
Form certain components (e.g., gates) of IC devices
Provide intraconnecting conduction paths between devices on chip
Connect the chip to external circuits
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Metallization Materials
Aluminum – most widely used metallization material
Favored for device intraconnections and connections to external circuitry
Other materials: polysilicon (Si); gold (Au); refractory metals (e.g., W, Mo); silicides (e.g., WSi2, MoSi2, TaSi2); and nitrides (e.g., TaN, TiN, and ZrN)
Applications such as gates and contacts
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Metallization Processes
Physical vapor deposition – PVD metallization processes include vacuum evaporation and sputtering
Chemical vapor deposition – CVD deposited materials include tungsten, molybdenum, and most silicides used in semiconductor metallization
Electroplating – occasionally used to increase thickness of thin films
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Etching
Certain steps in IC manufacturing require material removal from surface, accomplished by etching away unwanted material
Usually done selectively, by masking areas that are to be protected and leaving other areas exposed
Two categories of etching process:
Wet chemical etching
Dry plasma etching
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Wet Chemical Etching
Use of an aqueous solution, usually an acid, to etch away a target material
Etchant is selected to chemically attack the specific material and not the protective layer
Process variables are immersion time, etchant concentration, and temperature
In its simplest form, etching involves immersing the masked wafers for a specified time and then immediately rinsing to stop the etching
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Chemical etching reaction is isotropic, causing an undercut below protective mask
Mask pattern (resist) must be sized to compensate
Profile of a properly etched layer shown below
Chemical Etching
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Process Integration in IC Fabrication
An n‑channel metal oxide semiconductor (NMOS) logic device will be used to illustrate processing sequence
Starting substrate is a lightly doped p‑type silicon wafer, which will form the base of n‑channel transistor
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
IC Fabrication Sequence
Si3N4 mask is deposited by CVD on Si substrate, (2) SiO2 is grown by thermal oxidation in unmasked regions, (3) Si3N4 mask is stripped, (4) thin layer of SiO2 is grown by thermal oxidation
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
IC Fabrication Sequence
(5) Polysilicon is deposited by CVD and doped n+ using ion implantation, (6) poly-Si is selectively etched using photo-lithography to define gate electrode, (7) source and drain regions are formed by doping n+ in substrate, (8) P-glass is deposited onto surface for protection
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
IC Packaging
Final series of operations to transform the wafer into individual IC chips
(Accomplished after all of the processing steps on the wafer have been completed )
To connect the IC to the outside world, and to protect it from damage, the chip is attached to a lead frame and encapsulated inside a suitable package
The package is an enclosure, made of plastic or ceramic, that provides mechanical and environmental protection for the chip
The package includes leads by which the IC can be electrically connected to external circuits
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Design Issues in IC Packaging
Electrical connections to external circuits
Materials to encase chip and protect it from the environment
Humidity and corrosion
Temperature
Vibration and mechanical shock
Heat dissipation
Performance, reliability, and service life
Cost
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Manufacturing Issues in IC Packaging
Chip separation ‑ cutting wafer into individual chips
Connecting it to the package
Encapsulating the chip
Circuit testing
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
IC Package Design
Factors related to the design of an integrated circuit package:
Number of input/output terminals required for an IC of a given size
Materials used in IC packages
Package styles
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Input/Output (I/O) Terminals
Problem is to connect many internal circuits on the chip to I/O terminals so that the appropriate electrical signals can be communicated to the outside world
As the number of devices in the IC increases, the required number of I/O terminals also increases
The problem is aggravated by IC trends:
Decreases in device size
Increases in number of devices in IC
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
IC Package Materials
Ceramic (Al2O3)
Advantages: hermetic sealing of IC chip and highly complex packages can be produced
Disadvantage: poor dimensional control due to shrinkage during firing
Plastic (epoxies, polyimides, and silicones)
Not hermetically sealed, but cost is lower
Generally used for mass produced ICs, where very high reliability is not required
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Two Basic Types of IC Package
Through‑hole mounting, also called pin‑in‑hole (PIH) technology
IC package and other components have leads inserted through holes in PCB and soldered on underside
Surface mount technology (SMT)
Components are attached to surface of board (in some cases, both top and bottom surfaces)
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Types of component lead attachment on a printed circuit board: (a) through‑hole, and several styles of surface mount technology: (b) butt lead, (c) "J" lead, and (d) gull‑wing
Two Basic Types of IC Package
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Major IC Package Styles
Dual in‑line package (DIP)
Square package
Pin grid array
Some of these are available in both through‑hole and surface mount styles, while others are designed for only one mounting method
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
(a) Dual in‑line package with 16 terminals, shown here in through‑hole configuration and (b) square leaded chip carrier (LCC) for surface mounting with gull wing leads
(a) (b)
Dual In-Line Package (DIP)
©2012 John Wiley & Sons, Inc. M P Groover, Fundamentals of Modern Manufacturing 5/e
Processing Steps in IC Packaging
Wafer testing
Chip separation
Die bonding
Wire bonding
Package sealing
Final testing
©2012 John Wiley & Sons, I
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