In your own words, explain the reason for performing the experiment and give a concise summary of the theory involved, including any mathematical detail relevant to later discussion in the

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EET130 Week 2 Lab

Logic Gates

Instructor: Dr. Ali Setoodehnia

By: XSTUDENT

Date: 11/16/2022

Online EET Department

ECPI University

I pledge to support the Honor System of ECPI. I will refrain from any form of academic dishonesty or deception, such as cheating or plagiarism. I am aware that as a member of the academic community it is my responsibility to turn in all suspected violators of the honor code. I understand that any failure on my part to support the Honor System will be turned over to a Judicial Review Board for determination. I will report to a Judicial Review Board hearing if summoned.

XSTUDENT 11/16/2022

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I Abstract: Abstract The abstract should not exceed four or five sentences. The abstract should be self-

contained and meaningful on its own with the intent that any reader can understand the primary

purpose of the paper and/or findings of the lab at a very high summary level.

For example: Sample copy of past X-student

This lab report demonstrates Multisim simulation analysis of constructing different Logic Gates.

I have constructed six logic gate circuits, and with the aid of the supplied control sheets, I

have recorded my predicted values and measurements outputs for each Multisim Logic

Gate circuit using truth table. Also, I have compared some of logic circuits and

determined their similarities.

II Parts List:

Circuit 1

• 1 – OR gate

• 2 – 1 KOhm resistors

• 2 – SPDT switches

• 1 – Digital probe

• 2 – VCC (5V)

• 2 – GND

Circuit 2

• 1 – AND gate

• 2 – 1 KOhm resistors

• 2 – SPDT switches

• 1 – Digital probe

• 2 – VCC (5V)

• 2 – GND

Circuit 3

• 1 – 74LS32N (OR gate IC)

• 1 – 74LS04N (Hex Inverter IC)

• 1 – 1KOhm resistor

• 2 – SPDT switches

• 1 – Digital probe

• 1 – VCC (5V)

• 1 – GND

Circuit 4

• 1 – 74LS08N (AND gate IC)

• 1 – 74LS04N (Hex Inverter IC)

• 1 – 1KOhm resistor

• 2 – SPDT switches

• 1 – Digital probe

• 1 – VCC (5V)

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• 1 – GND

Circuit 5

• Same as circuit 4

Circuit 6

• Same as circuit 3

II. Introduction:

Sample copy of past X-student Throughout this lab I have constructed and demonstrated different logic gates using Multisim

simulation software. I have built 6 different circuits using a different gate for each circuit and

record the measurements data, then compare the results to my predicted values. Using Multisim

to build these circuits is a great hands-on experiment to see from the ground up how these gates

work and how they are utilized in circuits that are used in real world scenarios. This lab is

designed to demonstrate the properties of very basic logic gates and illustrate some of the

applications of Universal gates to implement functioning of other logic gates.

III. Procedures:

1. Write down “predicted output” values for Circuit 1 in Table 1 for given inputs.

2. Construct Circuit 1 shown in Figure 1 using components listed in parts list for Circuit 1.

3. For Circuit 1, change inputs A and B using SPDT switches and observe output using digital

probe connected to output. Write down “measured output” values in Table 1. If there are any

differences between “predicted” and “measured” output, find the error, and correct the

problem.

Figure 1: Circuit 1

Table 1: Circuit 1 results

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Input A Input B Predicted Output Measured Output

0 0 0 0

0 1 1 1

1 0 1 1

1 1 1 1

Multisim Circuit 1 Timestamp:

4. Write down “predicted output” values for Circuit 2 in Table 2 for given inputs.

5. Construct Circuit 2 shown in Figure 2 using components listed in parts list for Circuit 2.

6. For Circuit 2, change inputs A and B using SPDT switches and observe output using digital

probe connected to output. Write down “measured output” values in Table 2. If there are any

differences between “predicted” and “measured” output, find the error, and correct the

problem.

7. Sketch the

8. For Circuit 2, change inputs A, B, and C using SPDT switches and observe output using

digital probe connected to output. Write down “measured output” values in Table 2. These

values should be same as predicted values. If there are any differences between predicted and

measured values, find the error and correct the problem.

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Figure 2: Circuit 2

Table 2: Circuit 2 results

Input A Input B Predicted Output Measured Output

0 0 0 0

0 1 0 0

1 0 0 0

1 1 1 1

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Multisim Circuit 2 Timestamp:

9. Place 74LS32N and 74LS04N as shown in Figure 3 and make sure VCC (pin14) and GND

(pin 7) pins of both ICs are connected to 5V and ground, respectively.

10. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 2 for 74LS32N to SPDT

switches (to change inputs to high or low).

11. Connect pin 3 of 74LS32N to pin 1 of the 74LS04N. Next, connect digital probe to pin 2 of

74LS04N.

12. For Circuit 3, change inputs using SPDT switches and observe output using digital probe.

Write down “measured output” values in Table 3.

Figure 3: Circuit 3

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Table 3: Circuit 3 results

Input A Input B Measured Output

0 0 1

0 1 0

1 0 0

1 1 0

Multisim Circuit 3 Timestamp:

13. Place 74LS04N and 74LS08N as shown in Figure 4 and make sure VCC (pin14) and GND

(pin 7) pins of both ICs are connected to 5V and ground, respectively.

14. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 3 for 74LS04N to SPDT

switches (to change inputs to high or low).

15. Connect pin 2 of 74LS04N to pin 1 of the 74LS08N. Next, connect pin 4 of the 74LS04N to

pin 2 of the 74LS08N. Observe output by connecting digital probe to pin 3 of 74LS08N.

16. For Circuit 4, change inputs using SPDT switches and observe output using digital probe.

Write down “measured output” values in Table 4.

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Figure 4: Circuit 4

Table 4: Circuit 4 results

Input A Input B Measured Output

0 0 1

0 1 0

1 0 0

1 1 0

17. Compare measured output in tables 3 and 4 and indicate the relationship between the two

gates shown below.

From a logic perspective, the NOR gate is logically equivalent to an inverted input AND gate.

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Multisim Circuit 4 Timestamp:

18. Place 74LS08N and 74LS04N as shown in Figure 5 and make sure VCC (pin14) and GND

(pin 7) pins of both ICs are connected to 5V and ground, respectively.

19. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 2 for 74LS08N to SPDT

switches (to change inputs to high or low).

20. Connect pin 3 of 74LS08N to pin 1 of the 74LS04N. Next, observe output by connecting

digital probe to pin 2 of 74LS04N.

21. For Circuit 5, change inputs using SPDT switches and observe output using digital probe.

Write down “measured output” values in Table 5.

Figure 5: Circuit 5

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Table 5: Circuit 5 results

Input A Input B Measured Output

0 0 1

0 1 1

1 0 1

1 1 0

Multisim Circuit 5 Timestamp:

22. Connect 74LS04N and 74LS32N as shown in Figure 6 and make sure VCC (pin14) and GND

(pin 7) pins of both ICs are connected to 5V and ground, respectively.

23. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 3 for 74LS04N to SPDT

switches (to change inputs to high or low).

24. Connect pin 2 of 74LS04N to pin 1 of the 74LS32N. Next, connect pin 4 of 74LS04N to pin

2 of 74LS32N. Observe output by connecting digital probe to pin 3 of 74LS32N.

25. For Circuit 6, change inputs using SPDT switches and observe output using digital probe.

Write down “measured output” values in Table 6.

26. Compare measured output in tables 5 and 6 and indicate the relationship between the two

gates shown below.

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From a logic perspective, the NAND gate is logically equivalent to an inverted input OR gate.

Figure 6: Circuit 6

Table 6: Circuit 6 results

Input A Input B Measured Output

0 0 1

0 1 1

1 0 1

1 1 0

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IV. Conclusion:

This section should reflect your understanding of the paper / experiment. Important points to

include are a brief discussion of your final results, an interpretation of the actual experimental

results as they apply to the objectives of the experiment set out in the introduction should be

given. Also discuss any problems encountered and how they were resolved

Sample Copy of past X-Student:

Using Multisim, we can construct and test logic circuits to verify the truth table for the basic logic gates.

We were able to verify that from a logic perspective, the NOR gate is logically equivalent to an inverted

input AND gate, and that the NAND gate is logically equivalent to an inverted input OR gate.

Reference:

Floyd, T. L. (2014). Digital Fundamentals (11th ed.). Pearson Education (US).

https://ecpi.vitalsource.com/books/9780133524390